Application processing examples
We are introducing a grinding method, which grinds the ring section of a wafer, in the TAIKO process. When mounting a TAIKO wafer onto dicing tape, if the height difference between the ring section and TAIKO section is big, a large void is generated between the tape and wafer, which has a negative impact on the dicing. The ring grinding minimizes this height difference, so that it provides a better condition for affixing to the tape and higher quality of dicing.
A free-of-charge test cut is performed at an application lab to confirm whether achieving the customer's needs is possible.
Dicing and Grinding Service
It is effective in sample and prototype manufacturing during development or low-volume production. Designated engineers will provide support based on the desired leadtime and at reasonable cost.